Upload best.pt/best.onnx/confusion matrix + model card (Phase 2 step 2.7)

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README.md

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+---
+license: agpl-3.0
+library_name: ultralytics
+pipeline_tag: object-detection
+base_model: Ultralytics/YOLO26
+tags:
+  - ultralytics
+  - yolo
+  - yolo26
+  - object-detection
+  - pcb
+  - defect-detection
+  - manufacturing
+  - aoi
+model-index:
+  - name: pcb-defect-detection
+    results:
+      - task:
+          type: object-detection
+        dataset:
+          name: HRIPCB (PKU-Market-PCB), board-grouped split
+          type: hripcb
+        metrics:
+          - type: map50
+            value: 0.8390
+            name: "mAP50(B)"
+          - type: map50-95
+            value: 0.3881
+            name: "mAP50-95(B)"
+---
+
+# PCB Bare-Board Defect Detection (YOLO26)
+
+Ultralytics **YOLO26** (NMS-free, end-to-end detection head) fine-tuned to detect 6 classes of
+bare printed-circuit-board defects: `missing_hole`, `mouse_bite`, `open_circuit`, `short`, `spur`,
+`spurious_copper`.
+
+- **Code, training notebooks, benchmark/ablation scripts**: [https://github.com/tun0000/pcb-defect-detection](https://github.com/tun0000/pcb-defect-detection)
+- **Interactive demo**: [Space](https://huggingface.co/spaces/betty0/pcb-defect-detection)
+
+## Why this matters for AOI (Automated Optical Inspection)
+
+Per-class **recall** approximates an inspection line's escape rate (missed defects that reach the
+next stage); **precision** approximates the false-kill rate that drives manual re-inspection cost.
+YOLO26's NMS-free head means the exported ONNX/TensorRT graph needs only a confidence-threshold
+filter at inference time - no separate NMS step to tune or maintain.
+
+## Results (test split, never used for model selection)
+
+This model was trained with a **board-grouped split** (8 boards train / 1 val / 1 test - the test
+board's images never appear in training) rather than a random split, specifically to avoid the
+background leakage that inflates numbers when a random split lets the same physical board's
+background appear in both train and test.
+
+| split strategy | mAP50 | mAP50-95 | test images | test instances |
+|---|---|---|---|---|
+| **board-grouped (this model)** | 0.8390 | 0.3881 | 120 | 358 |
+| random (leakage control, separate model) | 0.9603 | 0.5082 | 72 | 284 |
+
+The random-split control model scores 12.1 mAP50 points higher - that gap is
+background leakage, not a better model. The board-grouped numbers above are the honest ones to
+cite for this model's real-world generalization.
+
+### Per-class (board-grouped model, this repo)
+
+| class | AP50 | AP50-95 | precision | recall |
+|---|---|---|---|---|
+| missing_hole | 0.9806 | 0.5825 | 0.9072 | 0.9667 |
+| mouse_bite | 0.9362 | 0.4563 | 0.9821 | 0.9141 |
+| open_circuit | 0.8963 | 0.4960 | 0.9584 | 0.7802 |
+| short | 0.5649 | 0.1282 | 0.7245 | 0.6271 |
+| spur | 0.8632 | 0.3982 | 0.9335 | 0.7024 |
+| spurious_copper | 0.7929 | 0.2677 | 0.8896 | 0.6717 |
+
+## Usage
+
+```python
+from huggingface_hub import hf_hub_download
+from ultralytics import YOLO
+
+path = hf_hub_download(repo_id="betty0/pcb-defect-detection", filename="best.pt")
+model = YOLO(path)
+results = model.predict("your_pcb_image.jpg", conf=0.25)
+```
+
+An ONNX export (`best.onnx`, NMS-free e2e graph, `(1, 300, 6)` output = `[x1, y1, x2, y2, conf,
+class_id]` in letterboxed 640x640 coordinates) is also included for torch-free deployment - see
+the GitHub repo's `src/pcb_defect/e2e_onnx.py` for a minimal ONNX Runtime inference pipeline
+(this is also what the Space above runs).
+
+## Training data
+
+[HRIPCB / PKU-Market-PCB](https://www.kaggle.com/datasets/akhatova/pcb-defects) (693 images, 2,953 annotated defects, 10 template boards).
+The Kaggle mirror used to obtain this data lists its license as "Unknown" - cite the original
+paper:
+
+> Huang, W., & Wei, P. (2019). A PCB Dataset for Defects Detection and Classification. arXiv:1901.08204 (https://arxiv.org/abs/1901.08204).
+
+## Limitations
+
+- Only 10 unique template boards exist in the source dataset; 8 were used for training. Per-board
+  visual variance is high, so board-grouped val/test metrics carry more variance than a
+  larger-board-count dataset would.
+- Defects are the dataset's synthetically-introduced defects, not naturally-occurring production
+  defects - real AOI imagery (lighting, focus, background) will differ (domain shift). Validate
+  against target production imagery before deployment.
+- `short` and `spurious_copper` are the weakest classes (see per-class table above) even after
+  full training - this is a real, repeatable finding (confirmed independently in a separate SAHI
+  slicing-inference ablation), not measurement noise.
+- Board-grouped metrics are **not directly comparable** to papers/notebooks reporting on a random
+  split of this same dataset (see the leakage comparison table above).
+
+## License
+
+Code and weights are released under **AGPL-3.0** (required by Ultralytics' YOLO26 license).
+Commercial use requires an [Ultralytics Enterprise License](https://www.ultralytics.com/license).

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